Abstract
SUMMARYThe construction of a combined scanning tunnelling and field ion microscope allowing the in situ preparation and analysis of the tunnelling tip is described. The apparatus is based on the Besocke type STM and includes a fast, automated sample approach, a sample transfer manipulator and a tip‐cooling mechanism for the FIM operation mode. The design is simple and needs a mechanical feedthrough only for sample transfer. A method has been developed to produce sharp tungsten tips with small clusters on the apex plane. Test‐run results of FIM and STM operation modes are discussed.
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