Abstract
This paper describes a 2.5-Gb/s/ch digital data recovery (DR) circuit for the SFI-5 interface. Although minimizing the circuit area has become critical in multibit interfaces such as the SFI-5, few studies have proposed a practical method of reducing the area of data recovery circuits. We introduce a digital-PLL-type DR circuit design with eye-tracking, which we developed to minimize the circuit area and power consumption without degrading tolerance against jitter. This novel method of data recovery enabled us to simplify the circuit design against process, voltage, and temperature variations. Design considerations on how to eliminate high-frequency jitter and how to track long-term wander are described. The design for 2.5-GHz clock distribution is also discussed. The area of the DR circuit, fabricated with 0.18-/spl mu/m SiGe BiCMOS technology, is 0.02 mm/sup 2//ch, and its power consumption is 50 mW/ch at 1.8 V. The measured tolerance against jitter at 2.5 Gb/s is 0.7 UI peak-to-peak, which satisfies the jitter specifications for the SFI-5.
Full Text
Topics from this Paper
Digital Data Recovery
Data Recovery Circuit
SiGe BiCMOS Technology
Clock Distribution
Power Consumption
+ Show 5 more
Create a personalized feed of these topics
Get StartedTalk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Similar Papers
Jun 12, 2003
Electronics
Oct 27, 2022
Microwave and Optical Technology Letters
Aug 27, 2014
Analog Integrated Circuits and Signal Processing
Aug 1, 2007
IEICE Electronics Express
Oct 25, 2020
Apr 1, 2014
Oct 1, 2007
May 24, 2009
IEEE Journal of Solid-State Circuits
Mar 1, 2005
IEEE Transactions on Circuits and Systems II: Express Briefs
Jun 1, 2020
Aug 1, 2011
Aug 1, 2011
Nov 3, 2003
IEEE Journal of Solid-State Circuits
IEEE Journal of Solid-State Circuits
Dec 1, 2023
IEEE Journal of Solid-State Circuits
Nov 1, 2023
IEEE Journal of Solid-State Circuits
Nov 1, 2023
IEEE Journal of Solid-State Circuits
Nov 1, 2023
IEEE Journal of Solid-State Circuits
Nov 1, 2023
IEEE Journal of Solid-State Circuits
Nov 1, 2023
IEEE Journal of Solid-State Circuits
Nov 1, 2023
IEEE Journal of Solid-State Circuits
Nov 1, 2023
IEEE Journal of Solid-State Circuits
Oct 1, 2023
IEEE Journal of Solid-State Circuits
Oct 1, 2023