Abstract
The biggest challenge in launching Micro‐LED displays is cost reduction. In our previous report (1), we proposed a super cost‐effective test method embedding EL and electrical testing (PEMPTM ). In this paper, we report the validity of PEMPTM by comparing the external quantum efficiency (EQE) of LED emission and photodetection characteristics.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.