Abstract
This chapter provides an introduction to electron spectroscopic imaging (ESI). ESI is employed for improving imaging and analysis in the transmission electron microscope using an electron energy loss spectrometer permanently integrated in the electron optical column. The spectrometer in the electron microscope enhances the contrast when imaging thin and conventionally prepared specimens. With thick specimens both contrast and resolution are improved. The depth of focus remains unaffected. Electron spectroscopic imaging produces significant contrast with ultra-thin and unstained specimens. Apart from enhanced imaging, the imaging spectrometer presents new possibilities for preparation—for staining in immunology, for the examination of freeze-dried specimens, and particularly for the analysis of ultramicroscopic structures. The chapter discusses several applications of modern conventional transmission electron microscopes (CTEM). These applications include—(1) imaging of conventional specimens, (2) imaging of thick specimens, (3) dark-field imaging, (4) imaging of very thin specimens, (5) imaging of immunolabeled specimens, and (6) analysis with electron energy losses.
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