Abstract
A three-dimensional shape measurement method is presented, which is a uniaxial measurement by measuring phase errors instead of the well-known phase, modulation or contrast. A sequence of exposures are captured by using a multi-step phase-shift technique with the binary fringes. Then the high-accuracy phases can be obtained by using all the exposures, meanwhile, a set of low-accuracy phases can be calculated by dividing those exposures into a set of four-step phase-shift measurements. For each pixel there will be a set of phase errors by subtracting low-accuracy phases from the high-accuracy ones. And the weighted phase error of every pixel can be calculated. Meanwhile the phase error caused by the improperly defocused binary fringes has a unique relationship with the depth z. Therefore, the 3D information of every pixel can be obtained by analyzing the phase errors. It will be promising for a uniaxial measurement, such as deep holes.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
