Abstract
This chapter deals with the use of piezoelectric wafer active sensors (PWAS) to detect structural damage using wave propagation techniques. This application of PWAS technology builds on the wealth of knowledge accumulated in the conventional nondestructive inspection (NDI), nondestructive testing (NDT), and nondestructive evaluation (NDE) fields. The main difference between our approach and conventional NDE is that our approach used permanently attached unobtrusive, minimally intrusive PWAS transducers. whereas the conventional NDE approach uses relatively large and expensive conventional ultrasonic transducers. For this reason, we see our approach as leading to an emerging new technology: embedded ultrasonic NDE . The embedded ultrasonic NDE will facilitate on-demand interrogation of the structure to determine its current state of health and predict the remaining life.
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