Abstract
A tested version of a test bench for studying the temperature dependence of the integrated current sensitivity of photodetectors is described. An original optical thermostat with a vertical beam path was used. This has made it possible to avoid the use of additional optical windows in the thermostat. Temperature control was carried out by a forward-biased emitter junction of a germanium transistor. The bias current was 100 μA. An experimental calibration of the temperature sensor was carried out in the range from 77 to 373 K. A blackbody model with a temperature of 800 K was used as a radiation source. Electrical circuits of the sensor and signal recorder for photodiodes are presented.
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