Abstract
Miniaturization of devices based on one-dimensional semiconductor nanocrystals is of high importance for high-frequency applications, photonics, and various sensors. Zinc oxide, one of the materials actively studied for such purposes, can be obtained by several technologies. Among them, chemical vapor deposition is distinguished by a low concentration of defects in the resulting structures. The aim of this work was to fabricate a test device on a single ZnO nanocrystal by means of nanomanipulation and to study its spectral response in the range from near-IR to UV. Since one of the promising applications of ZnO is UV sensors, the task was to test the selectivity of the response to the wavelength range below 400 nm.
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