Abstract
Purpose: For manufacturers that do not specialize in military technology, it is often difficult to perform adequate environmental stress screening (ESS) tests. To address this challenge, we propose a novel adaptive ESS test that considers defect information from the manufacturing process.BRMethods: To create a suitable ESS profile for the electronic equipment of a weapon system and make it cost-effective, we developed a mathematical model that uses the modified US-military standards MIL-HDBK-344 and MIL-HDBK-2164.BRConclusion: To validate the effectiveness of the adaptive ESS test model, we performed a case study using the production of over-discharge protection circuits. The result of the analysis indicates that five of 21 samples exceeded the allowed defect density. To find the five samples, the new optimized test method was applied with the following test parameters (△T/ cycles/ test time): 1) 84.29 ℃/ 9/ 1293.36 min, 2) 69.82 ℃/ 2/ 258.57 min, 3) 82.22 ℃/ 13/ 1841.37 min, 4) 88.61 ℃/ 8/ 1184.11 min, 5) 88.20 ℃/ 5/ 738.03 min.
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